Extend Tversky’s Ratio Model to an Asymmetric Similarity Measurement Model with Three Conditional Parameters: 3p-ASM Model

Autores: Wen He and Bapi Dutta and Yaya Liu and Rosa M. Rodriguez

Tipo: articulo_revista

Año: 2023

Revista: INTERNATIONAL JOURNAL OF COMPUTATIONAL IN℡LIGENCE SYSTEMS

Volumen: 16

DOI: 10.1007/s44196-023-00285-8

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